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SiPM Radiation Hardness Tests (view source)
Revision as of 01:29, 11 August 2010
, 01:29, 11 August 2010Created page with 'Although not discussed in the original requirements of the tagger microscope photo-detection, recent measurements have raised radiation hardness (specifically due to neutrons) as…'
Although not discussed in the original requirements of the tagger microscope photo-detection, recent measurements have raised radiation hardness (specifically due to neutrons) as a concern for silicon photomultiplier (SiPM) readout. [http://www.jlab.org/Hall-D/software/wiki/index.php?title=SiPM_Radiation_Hardness_Test&redirect=no Radiation tests] of Hamamatsu and SensL 3x3mm<sup>2</sup> units have been started by Dr. Yi Qiang at Jefferson Lab.
A similar test is necessary for the Photonique SiPM's currently intended for outfitting the tagger microscope. To suggest appropriate dose the following considerations are offered:
# since a sensor undergoes annealing (as has already been reported in literature) concurrently with the irradiation, an equilibrium may exist between the two processes or, at the very least, the degradation is slowed.
# much higher dose rates are applied in radiation hardness tests since the time scale of these tests is much smaller than the lifetime of the equipment in the Hall D complex
For these reasons, attempting to match the radiation dose of some nominal lifetime of the equipment based on some nominal neutron background is not important. Instead, a proper measurement of the damage rate, based on the separate performance parameters: dark rate, photo-detection efficiency and gain, as well as the healing rate of these parameters will offer a model for estimating the lifetime of these devices in their intended role. Therefore, doses should be selected roughly based on how much it takes to demonstrate a change in these performance parameters.
Since:
# dose rate is quoted per mass irradiated
# the mass of the silicon medium in a SiPM scales with the area (width of the wafers, for our purposes, taken to be roughly the same between various SiPMs)
# dark rate (current) scales with the area of the wafer
it seems therefore that '''similar doses should be applied to the Photonique SiPM as have been found effective in measurements with Hamamatsu and SensL units'''.
== Links ==
* [[Characterizing SiPMs]]
* [http://www.photonique.ch Photonique SA] SiPM Specification Sheets: SSPM-05~ [http://www.photonique.ch/DataSheets/SSPM_050701GR_TO18.pdf] and SSPM-06~ [http://www.photonique.ch/DataSheets/SSPM_0606BG4MM.pdf]
A similar test is necessary for the Photonique SiPM's currently intended for outfitting the tagger microscope. To suggest appropriate dose the following considerations are offered:
# since a sensor undergoes annealing (as has already been reported in literature) concurrently with the irradiation, an equilibrium may exist between the two processes or, at the very least, the degradation is slowed.
# much higher dose rates are applied in radiation hardness tests since the time scale of these tests is much smaller than the lifetime of the equipment in the Hall D complex
For these reasons, attempting to match the radiation dose of some nominal lifetime of the equipment based on some nominal neutron background is not important. Instead, a proper measurement of the damage rate, based on the separate performance parameters: dark rate, photo-detection efficiency and gain, as well as the healing rate of these parameters will offer a model for estimating the lifetime of these devices in their intended role. Therefore, doses should be selected roughly based on how much it takes to demonstrate a change in these performance parameters.
Since:
# dose rate is quoted per mass irradiated
# the mass of the silicon medium in a SiPM scales with the area (width of the wafers, for our purposes, taken to be roughly the same between various SiPMs)
# dark rate (current) scales with the area of the wafer
it seems therefore that '''similar doses should be applied to the Photonique SiPM as have been found effective in measurements with Hamamatsu and SensL units'''.
== Links ==
* [[Characterizing SiPMs]]
* [http://www.photonique.ch Photonique SA] SiPM Specification Sheets: SSPM-05~ [http://www.photonique.ch/DataSheets/SSPM_050701GR_TO18.pdf] and SSPM-06~ [http://www.photonique.ch/DataSheets/SSPM_0606BG4MM.pdf]