The device is expected to have a high enough gain (measured in electrons per photon detected) - around 10<sup>6</sup> in order for such a small light signal to be recorded by conventional electronics. SiPM devices are also susceptible to spurious, thermally excited pixel breakdowns, each showing up as a single photon hit ("dark count"). Very high rates of these single-pixel events may create pileup above the signal threshold. All of the above parameters (detection efficiency, gain and dark rate) depend on applied bias voltage and temperature. Stability of performance within the expected fluctuations of these environmental variables is an important requirement. | The device is expected to have a high enough gain (measured in electrons per photon detected) - around 10<sup>6</sup> in order for such a small light signal to be recorded by conventional electronics. SiPM devices are also susceptible to spurious, thermally excited pixel breakdowns, each showing up as a single photon hit ("dark count"). Very high rates of these single-pixel events may create pileup above the signal threshold. All of the above parameters (detection efficiency, gain and dark rate) depend on applied bias voltage and temperature. Stability of performance within the expected fluctuations of these environmental variables is an important requirement. |