SiPM Radiation Hardness Tests - Revision history

Jonesrt: /* Proposed Measurement Program */

2010-08-23T16:48:37Z

Proposed Measurement Program

Jonesrt at 16:48, 23 August 2010

2010-08-23T16:48:08Z

Jonesrt: /* Proposed Measurement Program */

2010-08-23T16:47:10Z

Proposed Measurement Program

Jonesrt: /* Proposed Measurement Program */

2010-08-23T16:43:26Z

Proposed Measurement Program

Senderovich at 06:28, 12 August 2010

2010-08-12T06:28:42Z

Senderovich: /* Proposed Measurement Program */

2010-08-12T06:17:46Z

Proposed Measurement Program

Senderovich: /* Proposed Measurement Program */

2010-08-12T06:03:42Z

Proposed Measurement Program

Senderovich: /* Proposed Measurement Program */

2010-08-11T01:43:00Z

Proposed Measurement Program

Senderovich at 01:31, 11 August 2010

2010-08-11T01:31:34Z

Senderovich: Created page with 'Although not discussed in the original requirements of the tagger microscope photo-detection, recent measurements have raised radiation hardness (specifically due to neutrons) as…'

2010-08-11T01:29:24Z

Created page with 'Although not discussed in the original requirements of the tagger microscope photo-detection, recent measurements have raised radiation hardness (specifically due to neutrons) as…'

New page

Although not discussed in the original requirements of the tagger microscope photo-detection, recent measurements have raised radiation hardness (specifically due to neutrons) as a concern for silicon photomultiplier (SiPM) readout. [http://www.jlab.org/Hall-D/software/wiki/index.php?title=SiPM_Radiation_Hardness_Test&redirect=no Radiation tests] of Hamamatsu and SensL 3x3mm<sup>2</sup> units have been started by Dr. Yi Qiang at Jefferson Lab.

A similar test is necessary for the Photonique SiPM's currently intended for outfitting the tagger microscope. To suggest appropriate dose the following considerations are offered:
# since a sensor undergoes annealing (as has already been reported in literature) concurrently with the irradiation, an equilibrium may exist between the two processes or, at the very least, the degradation is slowed.
# much higher dose rates are applied in radiation hardness tests since the time scale of these tests is much smaller than the lifetime of the equipment in the Hall D complex
For these reasons, attempting to match the radiation dose of some nominal lifetime of the equipment based on some nominal neutron background is not important. Instead, a proper measurement of the damage rate, based on the separate performance parameters: dark rate, photo-detection efficiency and gain, as well as the healing rate of these parameters will offer a model for estimating the lifetime of these devices in their intended role. Therefore, doses should be selected roughly based on how much it takes to demonstrate a change in these performance parameters.

Since:
# dose rate is quoted per mass irradiated
# the mass of the silicon medium in a SiPM scales with the area (width of the wafers, for our purposes, taken to be roughly the same between various SiPMs)
# dark rate (current) scales with the area of the wafer
it seems therefore that '''similar doses should be applied to the Photonique SiPM as have been found effective in measurements with Hamamatsu and SensL units'''.

== Links ==

* [[Characterizing SiPMs]]
* [http://www.photonique.ch Photonique SA] SiPM Specification Sheets: SSPM-05~ [http://www.photonique.ch/DataSheets/SSPM_050701GR_TO18.pdf] and SSPM-06~ [http://www.photonique.ch/DataSheets/SSPM_0606BG4MM.pdf]

@@ Line 18: / Line 18: @@
 === Proposed Measurement Program ===
-The following procedure uses as a unit of radiation dose the '''rem''' reported by the neutron dosimeter used in [http://www.jlab.org/Hall-D/software/wiki/index.php?title=SiPM_Radiation_Hardness_Test&redirect=no the study by Y. Qiang et.al. referenced above].
+The following procedure uses as a unit of radiation dose the '''rem''' based on the neutron dosimeter used in [http://www.jlab.org/Hall-D/software/wiki/index.php?title=SiPM_Radiation_Hardness_Test&redirect=no the study by Y. Qiang et.al. referenced above].
 # Irradiation with monitoring until the dark rate in the SiPM has increased by a factor 2 over the initial conditions, then allow the SiPM to self-anneal and monitor its recovery.

@@ Line 18: / Line 18: @@
 === Proposed Measurement Program ===
-The following procedure uses as a unit of radiation dose the '''rem''' reported by the neutron dosimeter used in the study
+The following procedure uses as a unit of radiation dose the '''rem''' reported by the neutron dosimeter used in [http://www.jlab.org/Hall-D/software/wiki/index.php?title=SiPM_Radiation_Hardness_Test&redirect=no the study by Y. Qiang et.al. referenced above].
 # Irradiation with monitoring until the dark rate in the SiPM has increased by a factor 2 over the initial conditions, then allow the SiPM to self-anneal and monitor its recovery.
 # Monitoring will consist of ''full measurements'' (see below) taken at several points during irradiation, and periodically during annealing.

@@ Line 18: / Line 18: @@
 === Proposed Measurement Program ===
+The following procedure uses as a unit of radiation dose the '''rem''' reported by the neutron dosimeter used in the study
 # Irradiation with monitoring until the dark rate in the SiPM has increased by a factor 2 over the initial conditions, then allow the SiPM to self-anneal and monitor its recovery.
 # Monitoring will consist of ''full measurements'' (see below) taken at several points during irradiation, and periodically during annealing.

@@ Line 19: / Line 19: @@
 === Proposed Measurement Program ===
-# Irradiation with about 40 rem over the course of a few days (source strength selected appropriately) with ''full measurement'' performed periodically.
+# Irradiation with monitoring until the dark rate in the SiPM has increased by a factor 2 over the initial conditions, then allow the SiPM to self-anneal and monitor its recovery.
-# Relaxation time (of duration determined by the apparent healing rate)  with ''full measurement'' performed periodically.
+# Monitoring will consist of ''full measurements'' (see below) taken at several points during irradiation, and periodically during annealing.
-# Repetition of 1. and 2. as desired to determine the recovery extent
+# The initial period between measurements while irradiating should be 1 rem, to be adjusted after a trend is observed.
-# Proceed with a longer irradiation period until significant curvature is seen in the change of the performance parameters in order to measure the decay function (e.g. two exponential?)
+# The initial period between measurements while annealing should be one day, to be adjusted after a relaxation time is observed.
 # Irradiate the unit for a much longer duration - until some saturation of the performance parameters is seen. This will help determine the offset in the model of the deterioration of performance parameters.

← Older revision		Revision as of 06:28, 12 August 2010
Line 35:		Line 35:
	* [[Characterizing SiPMs]]		* [[Characterizing SiPMs]]
	* [http://www.photonique.ch Photonique SA] SiPM Specification Sheets: SSPM-05~ [http://www.photonique.ch/DataSheets/SSPM_050701GR_TO18.pdf] and SSPM-06~ [http://www.photonique.ch/DataSheets/SSPM_0606BG4MM.pdf]		* [http://www.photonique.ch Photonique SA] SiPM Specification Sheets: SSPM-05~ [http://www.photonique.ch/DataSheets/SSPM_050701GR_TO18.pdf] and SSPM-06~ [http://www.photonique.ch/DataSheets/SSPM_0606BG4MM.pdf]
		+	* JLab [http://www.jlab.org/Hall-D/software/wiki/index.php?title=SiPM_Radiation_Hardness_Test&redirect=no SiPM Radiation Hardness Test]

@@ Line 1: / Line 1: @@
-Although not discussed in the original requirements of the tagger microscope photo-detection, recent measurements have raised radiation hardness (specifically due to neutrons) as a concern for silicon photomultiplier (SiPM) readout. [http://www.jlab.org/Hall-D/software/wiki/index.php?title=SiPM_Radiation_Hardness_Test&redirect=no Radiation tests] of Hamamatsu and SensL 3x3mm<sup>2</sup> units have been started by Dr. Yi Qiang at Jefferson Lab.
+Although not discussed in the original requirements of the tagger microscope photo-detection, recent measurements have raised radiation hardness (specifically due to neutrons) as a concern for silicon photomultiplier (SiPM) readout. [http://www.jlab.org/Hall-D/software/wiki/index.php?title=SiPM_Radiation_Hardness_Test&redirect=no Radiation tests] of Hamamatsu and SensL 3x3mm<sup>2</sup> units have been started by Dr. Yi Qiang at Jefferson Lab. A similar test is necessary for the Photonique SiPM's currently intended for outfitting the tagger microscope.
-A similar test is necessary for the Photonique SiPM's currently intended for outfitting the tagger microscope. To suggest appropriate dose the following considerations are offered:
+== Proposed Tests ==
 # since a sensor undergoes annealing (as has already been reported in literature) concurrently with the irradiation, an equilibrium may exist between the two processes or, at the very least, the degradation is slowed.
 # much higher dose rates are applied in radiation hardness tests since the time scale of these tests is much smaller than the lifetime of the equipment in the Hall D complex
@@ Line 11: / Line 15: @@
 # dark rate (current) scales with the area of the wafer
 it seems therefore that '''similar doses should be applied to the Photonique SiPM as have been found effective in measurements with Hamamatsu and SensL units'''.