[[Image:mexicanhat.jpg|thumb|A "Mexican Hat" function. (courtesy of [http://www.vector.org.uk/archive/v194/finn194.htm])]]
[[Image:mexicanhat.jpg|thumb|A "Mexican Hat" function. (courtesy of [http://www.vector.org.uk/archive/v194/finn194.htm])]]
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The Fourier Analysis method of interferograms was created in 1982 by M. Takeda, H. Ina and S. Kobayashi and originally intended as an alternative to Moire Topography and the phase-shifting technique [1,2]. However, this method was ineffective at analyzing closed fringe patterns. A revision to the method, solved this problem by utilizing a Cartesian to polar coordinate transform [3]. The result of which could then be analyzed using the original method proposed.
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The revised Fourier Analysis method does have several limitations. The first requirement is that the "measurement wave front be a monotonic function in the direction of the carrier frequency" [3]. For instance, if the surface to be analyzed resemble the image to the right were analyzed by the above method, it would look no different than a surface that decreased or increased from top to bottom. In order to analyze such a fringe pattern generated by such a surface, an additional fringe pattern giving the carrier frequency must be used.
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The Fourier Analysis method of interferograms was created in 1982 by M. Takeda, H. Ina and S. Kobayashi and originally intended as an alternative to Moire Topography and the phase-shifting technique [[#References|[2]]],[[#References|[3]]] . However, this method was ineffective at analyzing closed fringe patterns. A revision to the method, solved this problem by utilizing a Cartesian to polar coordinate transform [[#References|[4]]]. The result of which could then be analyzed using the original method proposed.
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The revised Fourier Analysis method does have several limitations. The first requirement is that the "measurement wave front be a monotonic function in the direction of the carrier frequency" [[#References|[4]]]. For instance, if the surface to be analyzed resemble the image to the right were analyzed by the above method, it would look no different than a surface that decreased or increased from top to bottom. In order to analyze such a fringe pattern generated by such a surface, an additional fringe pattern giving the carrier frequency must be used.