The tagging spectrometer is a
QDD configuration of magnets which is used to analyze the energy-degraded
electrons from the photon radiator and provide a quasi-monochromatic photon
beam between the energies of 3.0 and 11.4 GeV.
The electron energies are measured along a 10m focal plane whose average
intrinsic momentum resolution is 0.05% of the end-point energy. The focal plane instrumentation consists of
two hodoscopes, one comprised of 141 channels covering the complete momentum
range 0.25 – 0.95 E0 and the other (the microscope) comprised a
two-dimensional array of scintillating fibers subtending a segment of 5% E0 positioned around the primary coherent
bremsstrahlung peak. The horizontal
segmentation of the microscope provides tagged energy channels of approximately
8 MeV width, while the vertical segmentation provides bremsstrahlung angle
collimation at the focal plane that is complementary to the photon beam
collimation.
Stage one R&D consists of
the construction of a prototype segment of the microscope consisting of 5x8
array of scintillating fibers coupled by means of clear light fibers to silicon
photomultiplier detectors. A design for
a prototype circuit board will be developed on which the SiPM detectors will be
mounted, which will have on-board generation of the 50V bias for the SiPM’s,
signal preamplifiers and multiplexing circuitry. Experience gained with the microscope
prototype will be useful in specifying the final design for the fixed-array
hodoscope, so no separate prototyping for those detectors are envisaged at this
stage.
The principal components of
the GlueX photon beam line that require R&D are the diamond crystals for
the coherent bremsstrahlung source, the photon beam active collimator, and the
silicon microstrip detector for the photon beam polarimeter.
Stage one R&D regarding
diamonds must address the mechanical integrity of very thin diamond wafers
following the grinding process. It must also
address how these diamonds can be mounted to provide sufficient mechanical
stability for GlueX. It is important to
investigate the effects of electron beam radiation damage and determine the
effective lifetime of a crystal under the conditions of GlueX running, but that
will require a significant amount of coordination with other facilities and
should therefore be deferred to stage two.
The active collimator must be tested in the laboratory, and then tested
in the coherent bremsstrahlung beam line in Hall B. The existing silicon microstrip polarimeter
in Hall B provides a sufficient platform for testing the GlueX polarimetry
concept. Incremental improvements to
this device during the R&D phase of GlueX are envisioned, that will verify
that the expected linear polarization from the coherent bremsstrahlung source can
be attained at greater than half the end-point energy.
description |
number |
units |
cost /
unit |
total cost |
postdoc salary |
132 |
m-w |
65.0 k$ |
195.0 k$ |
postdoc travel to meetings |
6 |
trip to US |
2.5 k$ |
15.0 k$ |
postdoc travel for R&D |
6 |
to Jlab/CT |
4.0 k$ |
24.0 k$ |
diamond crystals |
6 |
wafers |
4.0 k$ |
24.0 k$ |
X-ray facility use |
500 |
hours |
50 $ |
25.0 k$ |
student labor (active
collimator) |
9 |
m-w |
500 $ |
4.5 k$ |
materials (active
collimator) |
|
supplies |
|
3.0 k$ |
electronics (active
collimator) |
4 |
pA amp |
2.0 k$ |
8.0 k$ |
student labor (hodoscope) |
60 |
m-w |
500 $ |
30.0 k$ |
materials (hodoscope) |
|
supplies |
|
13.0 k$ |
SiPM detectors (hodoscope) |
40 |
1mm2
SiPM |
150 $ |
6.0 k$ |
electronic parts
(hodoscope) |
|
supplies |
|
4.5 k$ |
FADC (hodoscope) |
1 |
ADC unit |
4.0 k$ |
4.0 k$ |
prototype circuit
manufacturing |
2 |
pcb |
500 $ |
1.0 k$ |
F1 TDC (hodoscope) |
1 |
TDC unit |
4.0 k$ |
4.0 k$ |
shipping for beam tests |
2 |
JLab/UConn |
500 $ |
1.0 $ |
silicon microstrips
(polarimeter) |
3 |
planes |
3.1 k$ |
9.3 k$ |
DAQ setup for beam tests |
1 |
crate, boards |
12.0 k$ |
12.0 k$ |
|
|
|
|
383.3 k$ |
description |
number |
units |
cost /
unit |
total cost |
postdoc salary |
1 |
44 m-w |
65.0 k$ |
65.0 k$ |
postdoc travel to meetings |
2 |
trip to US |
2.5 k$ |
5.0 k$ |
postdoc travel for R&D |
2 |
to Jlab/CT |
4.0 k$ |
8.0 k$ |
diamond crystals |
2 |
wafers |
4.0 k$ |
8.0 k$ |
|
|
|
|
86 k$ |
description |
number |
units |
cost /
unit |
total cost |
X-ray facility use at UConn |
100 |
hours |
50 $ |
5.0 k$ |
student labor (active
collimator) |
9 |
m-w |
500 $ |
4.5 k$ |
materials (active
collimator) |
|
supplies |
|
3.0 k$ |
student labor (hodoscope) |
15 |
m-w |
500 $ |
7.5 k$ |
materials (hodoscope) |
|
supplies |
|
1.0 k$ |
|
|
|
|
21.0 k$ |
description |
number |
units |
cost /
unit |
total cost |
postdoc salary |
1 |
44 m-w |
65.0 k$ |
65.0 k$ |
postdoc travel to meetings |
2 |
trip to US |
2.5 k$ |
5.0 k$ |
postdoc travel for R&D |
2 |
to Jlab/CT |
4.0 k$ |
8.0 k$ |
diamond crystals |
2 |
wafers |
4.0 k$ |
8.0 k$ |
|
|
|
|
86 k$ |
description |
number |
units |
cost /
unit |
total cost |
X-ray tests at UConn /
elsewhere |
200 |
hours |
50 $ |
10.0 k$ |
electronics (active
collimator) |
4 |
pA amp |
2.0 k$ |
8.0 k$ |
student labor (hodoscope) |
20 |
m-w |
500 $ |
10.0 k$ |
materials (hodoscope) |
|
supplies |
|
6.0 k$ |
SiPM detectors |
20 |
1mm2
SiPM |
150 $ |
3.0 k$ |
electronic parts (hodoscope) |
|
supplies |
|
1.5 k$ |
FADC (hodoscope) |
1 |
ADC unit |
4.0 k$ |
4.0 k$ |
prototype circuit
manufacturing |
2 |
pcb |
500 $ |
1.0 k$ |
|
|
|
|
43.5 k$ |
description |
number |
units |
cost /
unit |
total cost |
silicon microstrip chips |
3 |
planes |
3.1 k$ |
9.3 k$ |
|
|
|
|
9.3 k$ |
description |
number |
units |
cost /
unit |
total cost |
postdoc salary |
1 |
44 m-w |
65.0 k$ |
65.0 k$ |
postdoc travel to meetings |
2 |
trip to US |
2.5 k$ |
5.0 k$ |
postdoc travel for R&D |
2 |
to Jlab/CT |
4.0 k$ |
8.0 k$ |
diamond crystals |
2 |
wafers |
4.0 k$ |
8.0 k$ |
|
|
|
|
86 k$ |
description |
number |
units |
cost /
unit |
total cost |
X-ray tests at UConn /
elsewhere |
200 |
hours |
50 $ |
10.0 k$ |
student labor (hodoscope) |
25 |
m-w |
500 $ |
12.5 k$ |
materials (hodoscope) |
|
supplies |
|
6.0 k$ |
SiPM detectors |
20 |
1mm2
SiPM |
150 $ |
3.0 k$ |
F1 TDC (hodoscope) |
1 |
TDC unit |
4.0 k$ |
4.0 k$ |
electronic parts
(hodoscope) |
|
supplies |
|
3.0 k$ |
shipping for beam tests |
2 |
JLab/UConn |
500 $ |
1.0 $ |
|
|
|
|
39.5 k$ |
description |
number |
units |
cost /
unit |
total cost |
test boards + software |
1 |
|
12.0 k$ |
12.0 k$ |
|
|
|
|
12.0 k$ |
[1] Costs
incurred by